2558

CRC Press

c2011

xv, 415 p. ill. 25 cm

Devices, circuits, and systems

Includes bibliographical references and index , Radiation damage in silicon / Gianluigi Casse -- Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.] -- Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf -- Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Gr�egory Avenier ... [et al.] -- Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema -- Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.] -- Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark -- A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche -- Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.] -- Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.] -- Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.] -- SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr. -- Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.] -- Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro -- Fault-injection techniques for dependability analysis : an overview / Massimo Violante.

Iniewski, Krzysztof,