1975

Brandon, D. G

2nd ed

John Wiley

c2008

xiv, 536 p. ill. (some col.) 25 cm

Quantitative software engineering series

Includes bibliographical references and index , The concept of microstructure -- Microstructural features -- Crystallography & crystal structure -- Diffraction analysis of crystal structure -- Scattering Of radiation by crystals -- Reciprocal space -- X-ray diffraction methods -- Diffraction analysis -- Electron diffraction -- Optical microscopy -- Geometrical optics -- Construction of the microscope -- Specimen preparation -- Image contrast -- Working with digital images -- Resolution, contrast & image interpretation -- Transmission electron microscopy -- Basic principles -- Specimen preparation -- The origin of contrast -- Kinematic interpretation of diffraction contrast -- Dynamic diffraction & absorption effects -- Lattice imaging at high resolution -- Scanning transmission electron microscopy -- Scanning electron microscopy -- Components of the scanning electron microscope -- Electron beam - specimen interactions -- Electron excitation of x-rays -- Back-scattered electrons -- Secondary Electron Emission -- Alternative Imaging Modes -- Specimen Preparation & Topology -- Focused Ion Beam Microscopy -- Microanalysis in electron microscopy -- X-Ray Microanalysis -- Electron Energy-Loss Spectroscopy -- Scanning probe microscopy & related techniques -- Surface Forces & Surface Morphology -- Scanning Probe Microscopes -- Field-ion Microscopy & Atom-Probe Tomography -- Chemical analysis of surface composition -- X-Ray Photoelectron Spectroscopy -- Auger Electron Spectroscopy -- Secondary-Ion Mass Spectrometry -- Quantitative & tomographic analysis of microstructure -- Basic Stereological Concepts -- Accessible & Inaccessible Parameters -- Optimizing accuracy -- Automated Image analysis -- Tomography & three dimensional reconstruction

Kaplan, Wayne D