-
RecordNumber
91
-
Author
Bhushan, Manjul
-
Title
Microelectronic test structures for CMOS technology
-
Author Statement
Manjul Bhushan, Mark B. Ketchen.
-
Publication
New York :Springer
-
Publication Year
, 2011.
-
Collation
xxxiv, 373 pages : illustrations ; 24 cm
-
Index
index
-
Biblography
Includes bibliographical references
-
Subject
Metal oxide semiconductors, Complementary Testing
-
ADDED ENTRIES
AU Ketchen, Mark B
-
LC Class
TK
-
LC Number
7871.99
-
LC CutterNumber
.M44B49
-
LC Date
2011
-
ISBNN
978-1-4419-9376-2
-
Link To Document :
